The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Mar. 12, 2008
Yoshio Yamada, Nagano, JP;
Hiroshi Nakayama, Nagano, JP;
Mitsuhiro Nagaya, Nagano, JP;
Tsuyoshi Inuma, Nagano, JP;
Takashi Akao, Nagano, JP;
Yoshio Yamada, Nagano, JP;
Hiroshi Nakayama, Nagano, JP;
Mitsuhiro Nagaya, Nagano, JP;
Tsuyoshi Inuma, Nagano, JP;
Takashi Akao, Nagano, JP;
NHK Spring Co., Ltd., Yokohama-shi, JP;
Abstract
A probe card is provided that is capable of accurately ensuring the flatness and the parallelism with respect to a predetermined reference surface. A point (Q) of application of force applied from a leaf spring () that presses a portion near an edge portion of a surface of a probe head () from which a plurality of probes projects over an entire circumference in a direction of a substrate to the probe head () is positioned inside of an outer edge of the probe head (), and a point (P) of application of force applied from the retainer () that presses a portion near an edge portion of a space transformer () over an entire circumference in the direction of the substrate to the space transformer () is positioned inside of an outer edge of the space transformer ().