The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2013

Filed:

Nov. 06, 2008
Applicants:

Brian J. Gates, Osceola, WI (US);

Robert T. Krasa, Hudson, WI (US);

Przemyslaw P. Markowicz, Woodbury, MN (US);

Craig R. Sykora, New Richmond, WI (US);

Robert J. Devoe, Arden Hills, MN (US);

Dean Faklis, Wayland, NY (US);

Inventors:

Brian J. Gates, Osceola, WI (US);

Robert T. Krasa, Hudson, WI (US);

Przemyslaw P. Markowicz, Woodbury, MN (US);

Craig R. Sykora, New Richmond, WI (US);

Robert J. DeVoe, Arden Hills, MN (US);

Dean Faklis, Wayland, NY (US);

Assignee:

3M Innovative Properties Company, Saint Paul, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/027 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes scanning a radiation beam with respect to a multi-photon curable photoreactive composition. The radiation beam includes a power sufficient to at least partially cure a volume of the multiphoton curable photoreactive composition. The method further includes modifying a characteristic of the radiation beam as the radiation beam is scanned.


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