The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Sep. 13, 2010
Applicants:
Israel Schechter, Haifa, IL;
Valery Bulatov, Nesher, IL;
Inventors:
Israel Schechter, Haifa, IL;
Valery Bulatov, Nesher, IL;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 27/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of assaying a solid or liquid material, the method comprising: illuminating a sample of the material with pulses of light at a plurality of different wavelengths at which atoms and/or molecules in the material are ionized in multiphoton ionization (MPI) process; generating a value responsive to charge produced in the ionization process for each wavelength to provide an MPI spectrum for the material; and processing the MPI spectrum to assay an atom or molecule in the material.
Schechter, Israel. (2013). Multi-photon ionization spectrometer (U.S. Patent No. 8455813). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8455813
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile