The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2013

Filed:

Mar. 13, 2009
Applicant:

Shigetaka Kudo, Kanagawa, JP;

Inventor:

Shigetaka Kudo, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 3/14 (2006.01); H04N 5/335 (2011.01); H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is possible to achieve compatibility between suppressing dark current caused by a leak phenomenon and ensuring element reliability in a CMOS solid-state imaging device. When a pixel using electrons as signal charge is driven, the negative voltage level of each of control signals adapted to pulse-drive transistors in the pixel is adjusted so that the longer the charge accumulation time, the higher the voltage level. Preferably, the negative voltage level is grounded (GND) when no signal charge is accumulated. The negative voltage level is increased only when the charge accumulation time is long, which is the case where dark current caused by a leak phenomenon becomes a problem. Therefore, it is possible to suppress stress on the pixels and the gate oxide film of their drive circuits and degradation of the transistor characteristics even if dark current is suppressed.


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