The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Jun. 12, 2007
Shinji Osawa, Funabashi, JP;
Tetsuya Miyoshi, Tatebayashi, JP;
Tadahisa Saga, Gunma, JP;
Ryuzo Tobe, Maebashi, JP;
Hiroki Busujima, Ota, JP;
Shinji Osawa, Funabashi, JP;
Tetsuya Miyoshi, Tatebayashi, JP;
Tadahisa Saga, Gunma, JP;
Ryuzo Tobe, Maebashi, JP;
Hiroki Busujima, Ota, JP;
Panasonic Healthcare Co., Ltd., Toon-Shi, JP;
Abstract
There is provided a culture observation system by which even a culture other than an observation target culture can be cultured and observation can be properly performed by a microscope during culturing of the culture. A culture observation system S includes a culturing cabinetfor forming an environment suitable for culturing cells in a culturing roomand an image pick-up devicefor photographing a microscopic image of the cells. The image pick-up deviceincludes a light sourcewhich is provided in the culturing roomand a tablewhich is provided in the culturing roomto hold the culture as an image pick-up target, and a shelffor accommodating the cells is provided in the culturing roomother than the light sourceand the table