The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8453491 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 04, 2013

Filed:

Aug. 24, 2011
Applicants:

Meng-bin Yu, Wuhan, CN;

Ming-hui Luo, Wuhan, CN;

Chang-jun LI, Wuhan, CN;

Yu-lin Liu, Wuhan, CN;

Inventors:

Meng-Bin Yu, Wuhan, CN;

Ming-Hui Luo, Wuhan, CN;

Chang-Jun Li, Wuhan, CN;

Yu-Lin Liu, Wuhan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A drop test apparatus performs a drop test on a product. The drop test apparatus includes a drop control module and a support module. The drop control module includes a bottom plate and a support beam substantially perpendicularly attached to the bottom plate. The support module is attached at a predetermined height to the support beam and includes a lever for detecting whether the product is placed in a desired position. A support panel is disposed at a first end of the lever for supporting the product. A second end of the lever is under a predetermined force for maintaining the lever in a balanced state when the product is placed in the desired position.


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