The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
Nov. 22, 2011
James M. Johnson, Milton, VT (US);
Scott K. Springer, Burlington, VT (US);
Rainer Thoma, Essex Junction, VT (US);
Josef S. Watts, South Burlington, VT (US);
James M. Johnson, Milton, VT (US);
Scott K. Springer, Burlington, VT (US);
Rainer Thoma, Essex Junction, VT (US);
Josef S. Watts, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are embodiments of a method, system and program storage device for generating accurate performance targets for active semiconductor devices during technology node development in order to reduce the number of iterations required for model extraction and/or to improve model quality. In these embodiments, initial sets of performance targets for related semiconductor devices are generated, e.g., by making assumptions based on hardware measurements taken from semiconductor devices in prior technology nodes. Additional processes are then performed on the initial sets of performance targets prior to the modeling stage in order to detect and resolve any inconsistencies between the data in the sets. Specifically, plotting techniques are performed with respect to the performance targets. The results are analyzed to detect any inconsistencies indicating that the performance targets are inaccurate and adjustments are made to the performance targets in order to resolve those inconsistencies.