The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Mar. 03, 2011
Applicants:

Kenji Sakaue, Kanagawa, JP;

Tatsuyuki Ishikawa, Kanagawa, JP;

Yukio Ishikawa, Kanagawa, JP;

Kazuhiro Ichikawa, Kanagawa, JP;

Hironori Uchikawa, Kanagawa, JP;

Inventors:

Kenji Sakaue, Kanagawa, JP;

Tatsuyuki Ishikawa, Kanagawa, JP;

Yukio Ishikawa, Kanagawa, JP;

Kazuhiro Ichikawa, Kanagawa, JP;

Hironori Uchikawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An LDPC error detection/correction circuit according to an embodiment includes a selector that divides data into p groups based on a check matrix H including blocks made up of unit matrixes having a size p and shift blocks, a selector that divides a group into Y subgroups, a bit node storage section that stores LMEM variables to calculate a probability β in association with each first address, a check node storage section that stores TMEM variables to calculate an external value α in association with each second address, a rotator that performs rotation processing on the TMEM with a rotation value based on a shift value, and an operation circuit made up of (p/Y) operation units that perform parallel processing in subgroup units.


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