The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
Oct. 23, 2009
Applicants:
Masashi Kunii, Yokohama, JP;
Tomohiro Morimura, Kawasaki, JP;
Takaki Kuroda, Machida, JP;
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A management system, which manages an information processing system by identifying a cause location based on previously defined analysis rule information, displays a status that is a condition of the analysis rule information but is not receivable, based on acquirable status information of the apparatuses making up the information processing system or information about statuses received in the past.
Kunii, Masashi. (2013). Method and computer for designing fault cause analysis rules in accordance with acquirable machine information (U.S. Patent No. 8453014). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8453014
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile