The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Aug. 13, 2010
Applicants:

Akiyoshi D. Iida, Las Vegas, NV (US);

David B. Bailey, Truckee, CA (US);

Jonathan R. Jacobs, Seattle, WA (US);

Inventors:

Akiyoshi D. Iida, Las Vegas, NV (US);

David B. Bailey, Truckee, CA (US);

Jonathan R. Jacobs, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are various embodiments for searching for items in a catalog using normalized item attributes. A range of values on a normalized scale is determined for an option for an attribute associated with a representative item. The range of values of the representative item is correlated with a first unit on a first scale of item classification. Multiple items are identified based at least in part on the option for the attribute. Each of the items is associated with a respective option for the attribute that has a respective range of values on the normalized scale that overlaps the range of values of the representative item. The respective range of values of one or more of the items is correlated with a second unit on a second scale of item classification.


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