The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Jul. 15, 2010
Applicant:

Wei Peng, Webster, NY (US);

Inventor:

Wei Peng, Webster, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30598 (2013.01);
Abstract

Methods and systems for clustering information items using nonnegative tensor factorization are disclosed. A processing device receives one or more class labels, each corresponding to an information item, a selection for a nonnegative tensor factorization model having an associated objective function and one or more parameter values, each corresponding to one of one or more penalty constraints. The processing device determines a constrained objective function based on the objective function associated with the selected nonnegative tensor factorization model, the one or more parameter values and the one or more class labels and including the one or more penalty constraints. The processing device determines clusters for the plurality of information items by evaluating the constrained objective function. Pairwise constraints may be received in addition to or instead of the class labels.


Find Patent Forward Citations

Loading…