The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
May. 09, 2008
Alessandro Balsamo, Turin, IT;
Michele Verdi, Rivoli, IT;
Alessandro Balsamo, Turin, IT;
Michele Verdi, Rivoli, IT;
Hexagon Metrology S.p.A., Moncalieri, IT;
Istituto Nazionale di Ricerca Metrologica (I.N.RI.M.), Turin, IT;
Abstract
Disclosed is a method of determining geometric errors in a machine tool or measuring machine having a mobile unit for moving a target within a measuring volume. The method includes the steps of generating a succession of laser beams in different directions by means of an interferometer, and, for each direction, moving the target into a number of points along the beam; measuring, by means of the interferometer, the abscissa of each of the points from an origin located along the direction of the beam; acquiring the coordinates of each of the points by means of the machine; and determining error parameters of the machine on the basis of the abscissas measured by the interferometer, and the coordinates of the points acquired by the machine.