The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Jul. 29, 2011
Applicant:

Kei Itoh, Kanagawa, JP;

Inventor:

Kei Itoh, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distance measurement and photometry device includes a pair of distance measurement sensors each of which is a two-dimensional image sensor, a photometry sensor, which includes a two-dimensional image sensor, a pair of distance measurement lenses arranged to correspond to the pair of distance measurement sensors, a photometry lens arranged to correspond to the photometry sensor, a photometry process unit that calculates a brightness value of a subject, an exposure state setting unit that sets an exposure state correspond to at least the pair of distance measurement sensors, a distance measurement unit that measures a distance to the subject, wherein the exposure state setting unit alternates an exposure state of at least the pair of distance measurement sensors corresponding to a result of the photometry process unit.


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