The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
May. 30, 2008
Masaki Nakamura, Okazaki, JP;
Tomoaki Ishikawa, Okazaki, JP;
Koichi Nakao, Shinagawa, JP;
Motoki Kanba, Okazaki, JP;
Osamu Aisaka, Okazaki, JP;
Kiyokazu Okada, Miyoshi, JP;
Masaki Nakamura, Okazaki, JP;
Tomoaki Ishikawa, Okazaki, JP;
Koichi Nakao, Shinagawa, JP;
Motoki Kanba, Okazaki, JP;
Osamu Aisaka, Okazaki, JP;
Kiyokazu Okada, Miyoshi, JP;
Aisin AW Co., Ltd., Anjo, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
A feature extraction method includes: the step of grouping a cluster of features, in which an internal of the respective features is less than or equal to a predetermined grouping interval, to form a feature group, for a plurality of features of which feature information including at least information of a position and a feature type is included in a predetermined feature information storage unit; the step of excluding the feature, not suitable for use in an image recognition process of the feature with respect to image information, from the cluster of the features within the feature group; and the step of extracting a part or all of one or more of the features within the feature group remaining as a result of the exclusion step as a target feature suitable for the use in the image recognition process.