The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Jan. 11, 2011
Applicant:

Sen Wang, Rchester, NY (US);

Inventor:

Sen Wang, Rchester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a three-dimensional model from three or more images comprising: receiving three or more images, each image being captured from a different viewpoint and including a two-dimensional image together with a corresponding range map; designating a plurality of pairs of received images, each pair including a first image and a second image. For each of the designated pairs a geometric transform is determined by identifying a set of corresponding features in the two-dimensional images; removing any extraneous corresponding features to produce a refined set of corresponding features; and determining the geometrical transformation for transforming three-dimensional coordinates for the first image to three-dimensional coordinates for the second image responsive to three-dimensional coordinates for the refined set of corresponding features. A three-dimensional model is determined responsive to the three or more received images and the geometrical transformations for the designated pairs of received images.


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