The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Sep. 28, 2009
Applicants:

Hidetoshi Kawauchi, Kangawa, JP;

Toshiyuki Miyauchi, Kanagawa, JP;

Takashi Yokokawa, Kanagawa, JP;

Takuya Okamoto, Chiba, JP;

Hiroyuki Kamata, Kanagawa, JP;

Inventors:

Hidetoshi Kawauchi, Kangawa, JP;

Toshiyuki Miyauchi, Kanagawa, JP;

Takashi Yokokawa, Kanagawa, JP;

Takuya Okamoto, Chiba, JP;

Hiroyuki Kamata, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 1/06 (2006.01); H03K 5/01 (2006.01); H03K 5/159 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein is an information processor, including: a receiving section configured to receive an OFDM signal transmitted in accordance with an OFDM system; a FFT arithmetically operating section configured to carry out FFT for a signal within a predetermined interval of the OFDM signal; a delay profile estimating section configured to estimate delay profiles from the OFDM signal received by the receiving section; an inter-symbol interference amount estimating section configured to estimate inter-symbol interference amounts for a plurality of candidates for the predetermined interval, respectively, by using the delay profiles estimated by the delay profile estimating section; and a searching section configured to search for the candidate having the minimum inter-symbol interference amount estimated by the inter-symbol interference amount estimating section from among the plurality of candidates in the predetermined interval, and supply data on the candidate thus searched for as the predetermined interval to the FFT arithmetically operating section.


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