The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

May. 27, 2010
Applicant:

Yutaka Sasaki, Yokohama, JP;

Inventor:

Yutaka Sasaki, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fluorescence microscopeincludes an illumination optical systemthat illuminates a sample with excitation light, fluorescence detection optical systemsandthat detect fluorescence from the sample, optical membersandthat are disposed on an optical path of the illumination optical system and on an optical path of the fluorescence detection optical system, have different wavelength characteristics with each other, and are included in the illumination optical system and in the fluorescence detection optical system, a memorythat stores the wavelength characteristic of each of the optical members, and a displaythat displays each of the wavelength characteristic read out from the memory on the same frame, and displays fluorescence detection wavelength range of a detectable fluorescent dye added to the sample.


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