The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

May. 18, 2010
Applicants:

Martin S. Maltz, Rochester, NY (US);

Raja Bala, Pittsford, NY (US);

Yonghui Zhao, Penfield, NY (US);

Matthew Frederick Hoffmann, Ontario, NY (US);

Inventors:

Martin S. Maltz, Rochester, NY (US);

Raja Bala, Pittsford, NY (US);

Yonghui Zhao, Penfield, NY (US);

Matthew Frederick Hoffmann, Ontario, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

What is disclosed is a novel system and method for converting a set of L*a*b* values to CMYK color space in which all CMYK formulations that produce each L*a*b* value are found and enumerated. The CMYK formulations are found through a search algorithm starting with the lightest L*a*b* values then visiting neighboring L*a*b* values until the entire L*a*b* color set has been processed. The CMYK space is tessellated into a set of pentahedrons, and for each L*a*b* value, an enclosing pentahedron is found and the CMYK values corresponding to where the locus of this point penetrates each surface is recorded. Adjacent pentahedrons are then visited and this process continues until the gamut boundary is reached. The result is a piecewise linear representation of the CMYK locus containing all values that will give the target L*a*b* value. The present method provides a flexible and powerful approach for solving color management problems.


Find Patent Forward Citations

Loading…