The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Aug. 30, 2012
Applicants:

Seongchong Park, Daejeon, KR;

Dong Hoon Lee, Daejeon, KR;

Seung Nam Park, Daejeon, KR;

Inventors:

Seongchong Park, Daejeon, KR;

Dong Hoon Lee, Daejeon, KR;

Seung Nam Park, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrating sphere photometer and a measuring method of the same are provided to precisely measure a directional light source. The integrating sphere photometer includes an integrating sphere having a plurality of through-holes, a plurality of photometers disposed at the through-holes, baffles disposed in front of the photometers to be spaced apart therefrom, an auxiliary light source disposed inside the integrating sphere, an auxiliary baffle disposed in front of the auxiliary light source, and a summing unit of output signals of the photometers under the illumination of a light source to be measured disposed in the central area inside the integrating sphere.


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