The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
Jul. 15, 2010
Hsin-yueh Sung, Taipei County, TW;
Chir-weei Chang, Taoyuan County, TW;
Hsin-Yueh Sung, Taipei County, TW;
Chir-Weei Chang, Taoyuan County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
An optical imaging system with extended depth of focus is provided. The optical imaging system includes an optical imaging module, an array type detector and an image restoration module. The optical imaging module has a specific longitudinal spherical aberration corresponding to the depth of focus. The array type detector is coupled to the optical imaging module to obtain a image via the specific longitudinal spherical aberration provided by the optical imaging module. The image restoration module is coupled to the array type detector, wherein the array type detector converts the obtained image to a digitalized image and the image restoration module receives the digitalized image and performs an image restoration operation to the digitalized image to form an image with extended depth of focus.