The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

May. 10, 2012
Applicants:

Benjamin A. Fox, Rochester, MN (US);

Nathaniel J. Gibbs, Iowa City, IA (US);

Andrew B. Maki, Rochester, MN (US);

David M. Onsongo, Manor, TX (US);

Trevor J. Timpane, Rochester, MN (US);

Inventors:

Benjamin A. Fox, Rochester, MN (US);

Nathaniel J. Gibbs, Iowa City, IA (US);

Andrew B. Maki, Rochester, MN (US);

David M. Onsongo, Manor, TX (US);

Trevor J. Timpane, Rochester, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for calibrating resistors on an integrated circuit chip via a daisy chain scheme. The method comprises the step of configuring one or more links of the daisy chain scheme, wherein each of the one or more links comprises one or more master resistors and one or more slave resistors. The method further comprises the steps of calibrating at least one on-chip reference resistor, the one or more master resistors, and the one or more slave resistors via the daisy chain scheme. The method using the daisy chain scheme enables resistance of at least one off-chip reference resistor to be duplicated to multiple distant locations while maintaining a low mismatch error.


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