The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
Jul. 29, 2010
Applicant:
Daiya Nakamura, Kawasaki, JP;
Inventor:
Daiya Nakamura, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2006.01); G06F 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of detecting a failure in an information processing apparatus is provided. The method includes detecting at least one of a power supply failure and a unit failure, monitoring the detected unit failures, and determining a detected unit failure for a first unit is erroneous if the monitoring indicates another of the units receiving power from a same power supply system as the first unit has also detected a unit failure. The power supply failure indicates a failure associated with a power supply system affecting more than one of the units, and the unit failure indicates a failure of one of the units.