The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2013
Filed:
Nov. 10, 2010
Changhuei Yang, Pasadena, CA (US);
Charles Dimarzio, Cambridge, MA (US);
Meng Cui, Ashburn, VA (US);
Ying Min Wang, Pasadena, CA (US);
Changhuei Yang, Pasadena, CA (US);
Charles DiMarzio, Cambridge, MA (US);
Meng Cui, Ashburn, VA (US);
Ying Min Wang, Pasadena, CA (US);
California Institute of Technology, Pasadena, CA (US);
Northeastern University, Boston, MA (US);
Abstract
A light microscope for imaging a sample containing one or more fluorescent agents, comprising a source for generating acoustic waves that are focused at a focus in the sample, wherein the acoustic waves frequency shift a frequency of light passing through the focus, thereby creating a frequency shifted light beam; at least one spatial light modulator (SLM) positioned to illuminate the sample with an output beam that is an optical phase conjugate of the frequency shifted light beam, wherein the output beam is a reflection of a first reference beam off one or more pixels of the SLM, and the pixels are for modulating the first reference beam to create the output beam; and a detector positioned to detect fluorescence generated by the output beam exciting the fluorescent agents at the focus in the sample, thereby imaging the sample.