The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2013

Filed:

Sep. 29, 2010
Applicant:

Yuya Nakako, Aichi, JP;

Inventor:

Yuya Nakako, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eyeglass lens processing apparatus includes lens chuck shafts, processing tools for processing a lens and processing tool rotating shafts to which the processing tools are attached. A calibration sensor unit for calibrating the eyeglass lens processing apparatus includes: an attachment portion attached to the lens chuck shafts; a contact member contacting the processing tools; a support mechanism configured to movably support the contact member and has an urging member that urges the contact member in a direction separating from the attachment portion; and a sensor that detects the contact of the contact member with the processing tools. The urging member has an urging force by which the processing tool rotating shafts and the lens chuck shafts are not bent to a predetermined tolerance or more when the contact member contacts the processing tools and is moved toward the attachment portion.


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