The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Dec. 17, 2010
Jon D. Pulsipher, North Bend, WA (US);
Parham Mohadjer, Redmond, WA (US);
Nazeeh Amin Eldirghami, Redmond, WA (US);
Shao Liu, Bellevue, WA (US);
Patrick Orville Cook, Monroe, WA (US);
James Chadon Foster, Redmond, WA (US);
Ronald Omega Forbes, Jr., Seattle, WA (US);
Szymon P. Stachniak, Kirkland, WA (US);
Tommer Leyvand, Seattle, WA (US);
Joseph Bertolami, Seattle, WA (US);
Michael Taylor Janney, Sammamish, WA (US);
Kien Toan Huynh, Redmond, WA (US);
Charles Claudius Marais, Duvall, WA (US);
Spencer Dean Perreault, Bellevue, WA (US);
Robert John Fitzgerald, Kirkland, WA (US);
Wayne Richard Bisson, Seattle, WA (US);
Craig Carroll Peeper, Kirkland, WA (US);
Jon D. Pulsipher, North Bend, WA (US);
Parham Mohadjer, Redmond, WA (US);
Nazeeh Amin ElDirghami, Redmond, WA (US);
Shao Liu, Bellevue, WA (US);
Patrick Orville Cook, Monroe, WA (US);
James Chadon Foster, Redmond, WA (US);
Ronald Omega Forbes, Jr., Seattle, WA (US);
Szymon P. Stachniak, Kirkland, WA (US);
Tommer Leyvand, Seattle, WA (US);
Joseph Bertolami, Seattle, WA (US);
Michael Taylor Janney, Sammamish, WA (US);
Kien Toan Huynh, Redmond, WA (US);
Charles Claudius Marais, Duvall, WA (US);
Spencer Dean Perreault, Bellevue, WA (US);
Robert John Fitzgerald, Kirkland, WA (US);
Wayne Richard Bisson, Seattle, WA (US);
Craig Carroll Peeper, Kirkland, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Technology for testing a target recognition, analysis, and tracking system is provided. A searchable repository of recorded and synthesized depth clips and associated ground truth tracking data is provided. Data in the repository is used by one or more processing devices each including at least one instance of a target recognition, analysis, and tracking pipeline to analyze performance of the tracking pipeline. An analysis engine provides at least a subset of the searchable set responsive to a request to test the pipeline and receives tracking data output from the pipeline on the at least subset of the searchable set. A report generator outputs an analysis of the tracking data relative to the ground truth in the at least subset to provide an output of the error relative to the ground truth.