The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Jan. 19, 2010
Applicants:

Yukiko Seki, Kawasaki, JP;

Motoyuki Kawaba, Kawasaki, JP;

Inventors:

Yukiko Seki, Kawasaki, JP;

Motoyuki Kawaba, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A model-match-rate evaluating unit of a transaction monitoring device, which monitors a transaction system, evaluates a ratio of the number of transactions that match any models and respective processing times of all layers in the transaction are each within a corresponding normal range to the number of transactions observed per unit time as a model match rate. When the model-match-rate evaluating unit detects an abnormality of the system based on the model match rate, a suspicious-point-in-suspicious-model extracting unit of a transaction detail analyzing device extracts a point where a processing time deviates from the normal range as a suspicious point, a problematical-point evaluating unit evaluates a problem of each suspicious point as a problematical point, and a detail-analysis-result display unit displays an evaluation result of the problematical point and the suspicious point.


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