The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Jan. 31, 2012
Applicants:

Masood Mortazavi, San Jose, CA (US);

Jacob Y. Levy, Los Altos, CA (US);

Sahaya Andrews Albert, San Jose, CA (US);

Inventors:

Masood Mortazavi, San Jose, CA (US);

Jacob Y. Levy, Los Altos, CA (US);

Sahaya Andrews Albert, San Jose, CA (US);

Assignee:

Yahoo! Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A ProbeSystem for one or more Replicas is disclosed. For each replica, the Probe System includes a ProbeHead that updates a Head field in a Target Record pertaining to the Replica and a ProbeEcho that updates an Echo field in the TargetRecord. The Head field includes a time stamp and an epoch value. The Echo field includes a latency value and an epoch value. The fields are such that, during reporting, the ProbeHead can analyze the TargetRecord for the replica to determine the latency between one or more paths between the Replica and other Replicas. The ProbeSystem has a peer-to-peer shared nothing architecture and applies to a large class of high-replica, distributed and high-scale cloud storage systems and services.


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