The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

May. 23, 2012
Applicant:

Michael K. Burkland, Tucson, AZ (US);

Inventor:

Michael K. Burkland, Tucson, AZ (US);

Assignee:

Rayheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fixed-source array test station provides a compact cost-effective high-throughput test bed for testing optical sensors that require stimulus at fixed angular positions. An array of fixed collimated sources at different angular positions in the sensor's FOV are positioned on a surface of a focal sphere at the effective focal length of a spherical lens and aligned along respective radial lines to the center of the spherical lens so that each said divergent optical beam is collimated by the spherical lens to form a collimated optical beam that overlaps the entire entrance pupil of the optical seeker. The sources are activated in accordance with an activation profile in order to calibrate or otherwise test the sensor.


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