The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Apr. 23, 2008
Norio Masuda, Tokyo, JP;
Norio Masuda, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An electromagnetic field distribution measurement apparatus () according to the present invention includes: an electromagnetic field probe () for measuring an electromagnetic field distribution; a scan apparatus () for scanning the vicinity of a wiring () with the electromagnetic field probe (); and a data processing apparatus () for calculating the offset value (ΔXd) of the coordinate of the electromagnetic field probe () from the coordinate of the wiring (). The data processing apparatus () extracts a characteristic point (Eto E) of the measured electromagnetic field distribution and calculates the offset value (ΔXd) based on the coordinates of the extracted characteristic point (Eto E).