The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Oct. 14, 2008
Masahiro Aga, Ehime, JP;
Koji Miyoshi, Ehime, JP;
Mie Takahashi, Ehime, JP;
Hideyuki Kurokawa, Ehime, JP;
Takahiko Tanida, Ehime, JP;
Ryosuke Yamada, Ehime, JP;
Yoko Matsuda, Ehime, JP;
Masahiro Aga, Ehime, JP;
Koji Miyoshi, Ehime, JP;
Mie Takahashi, Ehime, JP;
Hideyuki Kurokawa, Ehime, JP;
Takahiko Tanida, Ehime, JP;
Ryosuke Yamada, Ehime, JP;
Yoko Matsuda, Ehime, JP;
Panasonic Corporation, Osaka, JP;
Abstract
By measuring a luminance difference between predetermined two points or a luminance variation in a predetermined region in a state in which a liquid sample is developed in a chromatography specimen, and comparing the luminance difference or the luminance variation with a preset reference value, it is possible to automatically detect degradation such as a decrease in hydrophilicity in the lower portion of a liquid-impermeable sheet materialduring a chromatography inspection, thereby enabling an accurate inspection.