The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8447076 B1

PDF
Full Text
Expired
Date of Patent:
May. 21, 2013

Filed:

Feb. 27, 2009
Applicants:

Takahisa Yamamoto, Kawasaki, JP;

Yoshinori Ito, Tokyo, JP;

Masao Yamanaka, Tokyo, JP;

Inventors:

Takahisa Yamamoto, Kawasaki, JP;

Yoshinori Ito, Tokyo, JP;

Masao Yamanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing device clips a plurality of partial images from an image, and calculates difference values of pixel values between a target pixel and surrounding pixels surrounding the target pixel in the partial images. Then, the image processing device decides parameter values corresponding to respective surrounding pixels based on identification information that identifies the partial image from among the plurality of the partial images and the difference values, and calculates a feature amount corresponding to the target pixel using the parameter value decided. Then, the image processing device obtains a feature amount of the partial images by calculating the feature amount with the above-described steps, using each pixel in the partial images as the target pixels.


Find Patent Forward Citations

Yamamoto, Takahisa. (2013). Image processing method, pattern detection method, pattern recognition method, and image processing device (U.S. Patent No. 8447076). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8447076

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