The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Mar. 22, 2011
Applicants:

Frank Sprenger, Cary, NC (US);

Moritz Beckmann, Cary, NC (US);

Yuan Cheng, Cary, NC (US);

Houman Jafari, Cary, NC (US);

Inventors:

Frank Sprenger, Cary, NC (US);

Moritz Beckmann, Cary, NC (US);

Yuan Cheng, Cary, NC (US);

Houman Jafari, Cary, NC (US);

Assignee:

XinRay Systems Inc, Research Triangle Park, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Multibeam field emission x-ray systems and related methods can include cathode elements, an anode assembly spaced from the plurality of cathode elements, and an extraction gate positioned between the plurality of cathode elements and the anode assembly. A potential difference can be applied between the extraction gate and at least one of the cathode elements to cause an emission of electrons from the respective cathode elements. Emission characteristics of the cathode elements can be measured, and the potential difference between the extraction gate and at least one of the cathode elements can be adjusted based on the emission characteristics measured.


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