The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Sep. 19, 2011
Applicants:

Hiroaki Kobayashi, Chiba, JP;

Toru Aida, Kanagawa, JP;

Akitoshi Suzuki, Shizuoka, JP;

Inventors:

Hiroaki Kobayashi, Chiba, JP;

Toru Aida, Kanagawa, JP;

Akitoshi Suzuki, Shizuoka, JP;

Assignees:

Sony Corporation, Tokyo, JP;

Sony DADC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 15/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

A disc inspecting method includes: forming recording marks on a disc; scanning the recording marks from inside to outside or from outside to inside of the disc by a pickup unit to read a reproduction signal while rotating a spindle to move a slider by each predetermined width; acquiring reproduction data from the reproduction signal in a signal acquiring unit; and determining whether or not the reproduction data is proper in a calculation unit, and optimizing a formation condition of the recording marks when it is determined that the reproduction data is not proper.


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