The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Sep. 25, 2006
Applicant:
Roland Seifert, Heidelberg, DE;
Inventor:
Roland Seifert, Heidelberg, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for adjusting a microscope stage. The microscope stage of the apparatus defines a plane on which an object to be examined can be placed. The apparatus further includes a first shaft and a second shaft rotationally coupled to the first shaft. The microscope stage is guided between the first and second shafts such that a rotational movement of at least one of the first and second shafts has a direct effect on the microscope stage.