The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
May. 18, 2009
Pinar Kurt, Cambridge, MA (US);
Debasish Banerjee, Ann Arbor, MI (US);
Robert E. Cohen, Jamica Plain, MA (US);
Michael Rubner, Westford, MA (US);
Masahiko Ishii, Okazaki, JP;
Minjuan Zhang, Ann Arbor, MI (US);
Pinar Kurt, Cambridge, MA (US);
Debasish Banerjee, Ann Arbor, MI (US);
Robert E. Cohen, Jamica Plain, MA (US);
Michael Rubner, Westford, MA (US);
Masahiko Ishii, Okazaki, JP;
Minjuan Zhang, Ann Arbor, MI (US);
Toyota Motor Engineering & Manufacturing North America, Inc., Erlanger, KY (US);
Toyota Motor Corporation, Toyota, JP;
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
The present invention discloses a non-quarter wave multilayer structure having a plurality of alternating low index of refraction material stacks and high index of refraction material stacks. The plurality of alternating stacks can reflect electromagnetic radiation in the ultraviolet region and a narrow band of electromagnetic radiation in the visible region. The non-quarter wave multilayer structure, i.e. nd≠nd≠λ/4, can be expressed as [A 0.5 qH pL(qH pL)0.5 qH G], where q and p are multipliers to the quarter-wave thicknesses of high and low refractive index material, respectively, H is the quarter-wave thickness of the high refracting index material; L is the quarter-wave thickness of the low refracting index material; N represents the total number of layers between bounding half layers of high index of refraction material (0.5 qH); G represents a substrate and A represents air.