The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2013
Filed:
Aug. 04, 2009
Applicants:
Ladan Arissian, Albuquerque, NM (US);
Jean-claude Diels, Albuquerque, NM (US);
Inventors:
Ladan Arissian, Albuquerque, NM (US);
Jean-Claude Diels, Albuquerque, NM (US);
Assignee:
STC.UNM, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A Scanning Phase Intracavity Nanoscope as a measurement system can be realized with a reference laser cavity and a sample laser cavity superimposed upon each other to operatively propagate two laser beams. The sample laser cavity is operatively formed by the sample to be measured. A measurement of the sample is based on differences in the reference laser cavity and the sample laser cavity determined from difference in the two laser beams.