The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Mar. 13, 2008
Applicants:

Tetsuya Kawanishi, Tokyo, JP;

Shinya Nakajima, Tokyo, JP;

Satoshi Shinada, Tokyo, JP;

Inventors:

Tetsuya Kawanishi, Tokyo, JP;

Shinya Nakajima, Tokyo, JP;

Satoshi Shinada, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01); G01B 9/02 (2006.01); H04B 10/04 (2006.01); H04B 10/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

Problems To provide a method for evaluating characteristics of MZ interferometers in an optical modulator having a plurality of MZ interferometers. Means for Solving Problems When an optical modulator includes a plurality of MZ interferometers, the 0-degree component contains a signal derived from an MZ interferometer other than the MZ interferometers for evaluating the characteristic. For this, it is impossible to accurately evaluate the characteristic of the MZ interferometers. The present invention does not use the 0-degree component normally having the highest intensity. That is, the characteristic of the MZ interferometers are evaluated by using a side band intensity of the component other than the 0-degree component.


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