The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Jul. 09, 2008
Applicants:

Bing Ouyang, Plano, TX (US);

John Michael Hayden, Allen, TX (US);

Troy Lane Ethridge, Bedford, TX (US);

Hong Jin Cho, Allen, TX (US);

Jeff Kordel, Frisco, TX (US);

Inventors:

Bing Ouyang, Plano, TX (US);

John Michael Hayden, Allen, TX (US);

Troy Lane Ethridge, Bedford, TX (US);

Hong Jin Cho, Allen, TX (US);

Jeff Kordel, Frisco, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for detecting a sampling clock offset of an analog-to-digital converter used to digitize an analog image signal. A method comprises buffering samples of an analog image signal, computing a value of an autocorrelation function using the buffered samples and a delayed version of the buffered samples, and repeating the computing a value for delays in a range of delays. The method also comprises computing a sampling frequency offset from the values of the autocorrelation function and changing a sampling frequency using the sampling frequency offset.


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