The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Jan. 23, 2009
Applicants:

Masaaki Ishida, Kanagawa, JP;

Yasuhiro Nihei, Kanagawa, JP;

Atsufumi Omori, Kanagawa, JP;

Dan Ozasa, Kanagawa, JP;

Jun Tanabe, Kanagawa, JP;

Inventors:

Masaaki Ishida, Kanagawa, JP;

Yasuhiro Nihei, Kanagawa, JP;

Atsufumi Omori, Kanagawa, JP;

Dan Ozasa, Kanagawa, JP;

Jun Tanabe, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/435 (2006.01); B41J 2/455 (2006.01); B41J 2/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

A deflector deflects a light beam emitted from a light source including a plurality of light-emitting units. A scanning optical system focuses the light beam deflected by the deflector on a scanning target surface. A monitoring photoreceiver receives a part of a light beam deflected by the deflector and directed toward an area within a scanning area outside an image area. A detecting unit individually detects emission powers of at least two light-emitting units based on an output signal of the monitoring photoreceiver in a single sweep of scanning.


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