The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

Aug. 05, 2008
Applicants:

Florian Espalieu, Grenoble, FR;

Paul Giletti, Nyons, FR;

Frédéric Poullet, Vizille, FR;

Inventors:

Florian Espalieu, Grenoble, FR;

Paul Giletti, Nyons, FR;

Frédéric Poullet, Vizille, FR;

Assignee:

Dolphin Integration, Meylan, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a test device for an analog circuit to be mounted on a mixed circuit including said analog circuit and a synchronous digital circuit. The test device includes a disturbance emulator connected to a first supply source (UrefD) capable of disturbing a second supply source (UrefA) of the analog circuit, the first and second supply sources being optionally merged, the emulator being adapted for receiving data representative of the evolution, during a given duration, of the average (μI) and the typical deviation (σI) of a first inrush current (I) that would be applied to the first supply source by the digital circuit, and being adapted for applying to the first supply source during successive intervals, each successive interval having said duration, a second inrush current (I) equal to the sum of the average and of the product of the typical deviation and of a pseudo-random signal varying according to a Gaussian law.


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