The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2013

Filed:

May. 21, 2010
Applicants:

Hiroshi Sasaki, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Inventors:

Hiroshi Sasaki, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning microscope device includes a light source that emits laser light; an X-Y galvanometer mirror that scans the laser light on a sample; an objective lens that irradiates the sample with the scanned laser light and collects fluorescence generated at an irradiated position; a non-descan-detection excitation DM that is disposed between the X-Y galvanometer mirror and the objective lens and separates the laser light and the fluorescence from each other; a fiber that receives the separated fluorescence through an entrance end thereof and emits the fluorescence from an exit end thereof that is formed in a substantially linear shape; a diffraction grating that disperses the fluorescence emitted from the exit end of the fiber in a direction orthogonal to a longitudinal direction of the exit end; and a multi-anode PMT having plural cells arrayed in the dispersing direction of the dispersed fluorescence.


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