The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Jun. 28, 2006
William Andruss, Minneapolis, MN (US);
Christopher Claudatos, San Jose, CA (US);
Bruce Leetch, Mason, OH (US);
Steven Terwilliger, Foster City, CA (US);
William Andruss, Minneapolis, MN (US);
Christopher Claudatos, San Jose, CA (US);
Bruce Leetch, Mason, OH (US);
Steven Terwilliger, Foster City, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Scanning is disclosed. A system is monitored to detect object events. A risk level is determined for an object event, and a scan is scheduled for an object associated with the object event according to the risk level. The risk level may be based on the risk level of the object type, and on the risk level of the operation. An immediate on access scan may be scheduled for a first risk range, a differential scan may be scheduled for a second risk range, and an incremental scan may be scheduled for a third risk range. The scheduled scan is performed.