The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8443227 B1

PDF
Full Text
Expired
Date of Patent:
May. 14, 2013

Filed:

Feb. 15, 2008
Applicants:

Steven R. Carlough, Poughkeepsie, NY (US);

Adam B. Collura, Hyde Park, NY (US);

Wen H. LI, Poughkeepsie, NY (US);

Eric M. Schwarz, Gardiner, NY (US);

Chung-lung Kevin Shum, Wappingers Falls, NY (US);

Inventors:

Steven R. Carlough, Poughkeepsie, NY (US);

Adam B. Collura, Hyde Park, NY (US);

Wen H. Li, Poughkeepsie, NY (US);

Eric M. Schwarz, Gardiner, NY (US);

Chung-Lung Kevin Shum, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A processor includes a microarchitecture for working around a processing flaw, the microarchitecture including: at least one detector adapted for detecting a predetermined state associated with the processing flaw; and at least one mechanism to modify default processor processing behavior; and upon modification of processing behavior, the processing of an instruction involving the processing flaw can be completed by avoiding the processing flaw.


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