The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2013

Filed:

Jun. 02, 2010
Applicants:

Yuuichi Suginishi, Fujisawa, JP;

Lengyel Attila, San Jose, CA (US);

Yoichi Nonaka, Yokohama, JP;

Inventors:

Yuuichi Suginishi, Fujisawa, JP;

Lengyel Attila, San Jose, CA (US);

Yoichi Nonaka, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dynamic maintenance planning apparatus including a maintenance planning device and a priority calculating device is provided. The maintenance planning device determines a maintenance date and time on and at which the throughput of a manufacturing system is maximum from among possible maintenance dates and times based on a simulation result in which a specific manufacturing apparatus on a manufacturing system is stopped at a specified maintenance date and time, and, for the maintenance at the determined maintenance date and time, specifies a lot whose completion is predicted to be delayed. The priority calculating device calculates a priority of the lot whose completion is predicted to be delayed so as to prevent waiting time of the lot during the maintenance.


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