The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2013

Filed:

Apr. 30, 2009
Applicants:

Matthew Edward Dragovich, West Chester, OH (US);

Patrick Joseph Howard, Cincinnati, OH (US);

Joshua Brian Jamison, Liberty Township, OH (US);

Toby George Darkins, Jr., Loveland, OH (US);

Joseph Manuel Portaz, Hamilton, OH (US);

Inventors:

Matthew Edward Dragovich, West Chester, OH (US);

Patrick Joseph Howard, Cincinnati, OH (US);

Joshua Brian Jamison, Liberty Township, OH (US);

Toby George Darkins, Jr., Loveland, OH (US);

Joseph Manuel Portaz, Hamilton, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.


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