The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2013

Filed:

Feb. 23, 2010
Applicants:

Roger K. Tyler, Norman, OK (US);

Ronald D. Fowler, Yukon, OK (US);

Inventors:

Roger K. Tyler, Norman, OK (US);

Ronald D. Fowler, Yukon, OK (US);

Assignee:

Arinc Incorporated, Annapolis, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data.


Find Patent Forward Citations

Tyler, Roger. (2013). Methods of evaluating the quality of two-dimensional matrix dot-peened marks on objects and mark verification systems (U.S. Patent No. 8442297). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8442297

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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