The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Apr. 06, 2011
Hirokazu Yanai, Osaka, JP;
Hirokazu Yanai, Osaka, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An object detecting method includes dividing a standard pattern into two or more areas radially from a central point; selecting, in each divided area of the standard pattern, a standard pattern pixel position at the maximum distance from the area dividing central point as a standard pattern representative point; dividing a determined pattern into two or more areas; selecting, in each divided area of the determine pattern, a determined pattern pixel position at the maximum distance from the area dividing central point as a determined pattern representative point; determining a positional difference between the standard pattern representative point and the determined pattern representative point in the corresponding divided areas; and determining the determined pattern as a target object when the positional differences in all of the divided areas are within a predetermined range.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile