The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Apr. 12, 2010
Applicants:
Gregory C. Walsh, Walnut Creek, CA (US);
Ralph Storz, Danville, CA (US);
Inventors:
Gregory C. Walsh, Walnut Creek, CA (US);
Ralph Storz, Danville, CA (US);
Assignee:
Leica Geosystems AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
The performance of a laser scanner is optimized in the field by automatically determining appropriate laser parameters for the scan location. A laser control system uses information such as the environmental temperature to select an appropriate range of start points for various laser parameters, such as pump temperature and laser currents. Test pulses over that range can be used to determine optimal operating parameters.