The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2013
Filed:
Dec. 30, 2009
Ralf Ferber, Horsham, GB;
Franz Kirchheimer, Burgwedel, DE;
Andreas Laake, Kingston, GB;
WesternGeco L.L.C., Houston, TX (US);
Abstract
The present invention relates to producing a quality control measure for use during data acquisition and/or data processing of, preferably, seismic data. While or after obtaining the data, a surface consistent decomposition of the data is performed. From the surface consistent decomposition, one may compute a decomposed logarithmic spectra, and from the decomposed logarithmic spectra, one may compute one or more residua. An error attribute based on the one or more residua can be formulated, analyzed, and output. The error attribute can be used as a quality control measure or the analysis result can be used to produce a quality control measure.