The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2013

Filed:

Nov. 16, 2010
Applicant:

Mutsumi Suzuki, Kodaira, JP;

Inventor:

Mutsumi Suzuki, Kodaira, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The object of the invention is to provide a rotational angle measurement apparatus that is capable of correcting an error due to pin-angle error with a small amount of calculation operation. The rotational angle measurement apparatus includes a magnetic sensorand a signal processing unitM. The magnetic sensor includes two bridges comprising magneto-resistance elements each having a pinned magnetic layer. A ratio-calculation unitof the signal processing unitM calculates a ratio Vy/Vx of output signals Vx and Vy. A parameter correction unitsubtracts a predetermined correction parameter β from the ratio Vy/Vx calculated by the ratio-calculation unit. An a tan-processing unitconducts arctangent processing on the value calculated by the parameter correction unit and calculates an angle of magnetic field θ.


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